Brezplačna dostava za naročila nad 69.99 € na paketomatih Pošte Slovenije.

Preverjanje stanja naročila

Postanite del skupnosti ljubiteljev knjig z vsega sveta in uživajte v številnih ugodnostih. Ustvarite brezplačen račun

Brezplačna dostava Zásilkovna nad 69.99 €

Zbirna točka GLS 4.49 € Zbirna točka DPD 2.99 € Kurirska služba GLS 5.49 € Kurir DPD 3.49 € Kurirska služba Express One 3.49 € Zbirno mesto Express One 3.49 € Zbirno mesto Pošte Slovenije 3.49 € Dostava preko Pošte Slovenije 3.49 €

Kontakt

Kako nakupovati

Pomoč

Moj račun

▸ Prazna :-(

Brezplačna dostava za naročila nad 69.99 € na paketomatih Pošte Slovenije.

Semiconductor Material and Device Characterization 3e

Name: Semiconductor Material and Device Characterization 3e
Brand: John Wiley & Sons Inc
SKU: 01389606
Price: 243.98 EUR
Availability: InStock
Author: Dieter K. Schroder
ISBN: 9780471739067

Dieter K. Schroder

Jezik

Angleščina

Knjiga Trda

Koda Libristo: 01389606

Založba John Wiley & Sons Inc, januar 2006

Semiconductor Material and Device Characterization is the only book on the market devoted to the cha... Celoten opis

Koda Libristo: 01389606

591 b

243.98 €

Na zalogi pri dobavitelju Odposlali bomo v 9-15 dneh

Do 30 dni za vračilo

Drugi so kupili tudi

Ostražité zvieratká neuvedený autor

Trda

4.54 €

Nouvelle Methode de Culture Communications A l'Assemblee Nationale Goetz-L

Mehka

15.65 €

Gustaf Adolf Droysen Gustav Droysen

Mehka

23.53 €

Wirtschaftliche Bet tigung Der ffentlichen Hand in Der Bundesrepublik Deutschland Und Ihre Probleme Hans Horak

Mehka

50.10 €

L'EPICIER / LE NOTAIRE Honoré De Balzac

Mehka

7.67 €

Semiconductor Material and Device Characterization is the only book on the market devoted to the characterization techniques used by the modern semiconductor industry to measure diverse semiconductor materials and devices. It covers the full range of electrical and optical characterization methods while thoroughly treating the more specialized chemical and physical techniques. In the third edition, Professor Schroder has rewritten parts of each chapter and added two new chapters (Charge Based Measurements and Failure Analysis and Reliability), redrawn and updated most figures, and included new problems and approximately 100 new references.