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Multi-run Memory Tests for Pattern Sensitive Faults

Name: Multi-run Memory Tests for Pattern Sensitive Faults
Brand: Springer International Publishing AG
SKU: 19315838
Price: 48.76 EUR
Availability: InStock
Author: Ireneusz Mrozek
ISBN: 9783319912035

Ireneusz Mrozek

Jezik

Angleščina

Knjiga Trda

Koda Libristo: 19315838

Založba Springer International Publishing AG, julij 2018

This book describes efficient techniques for production testing as well as for periodic maintenance... Celoten opis

Koda Libristo: 19315838

118 b

48.76 €

Na zalogi pri dobavitelju Odposlali bomo v 10-13 dneh

30 dni za vračilo blaga

Drugi so kupili tudi

Zakreślacz fluo GR-219. Komplet 6 kolorów

binding.

4.13 €

AGENDA ESCOLAR SEMANAL 2021-2022 CROQUETA CROQUETA Y EMPANADILLA

Knjiga

20.28 €

This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations.