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Microscopy of Semiconducting Materials

Name: Microscopy of Semiconducting Materials
Brand: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
SKU: 01561653
Price: 206.29 EUR
Availability: InStock
Author: A.G. Cullis
ISBN: 9783540319146

Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK

A.G. Cullis

J.L. Hutchison

Jezik

Angleščina

Knjiga Trda

Koda Libristo: 01561653

Založba Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, april 2006

This is a long-established international biennial conference series, organised in conjunction with t... Celoten opis

Koda Libristo: 01561653

499 b

206.29 €

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This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction. Developments in materials science and technology covering the complete range of elemental and compound semiconductors are described in this volume.