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Materials Reliability in Microelectronics V: Volume 391

Name: Materials Reliability in Microelectronics V: Volume 391
Brand: Materials Research Society
SKU: 02060054
Price: 23.2 EUR
Availability: PreOrder
Author: William F. Filter
ISBN: 9781558992948

Jezik

Angleščina

Knjiga Trda

Koda Libristo: 02060054

Založba Materials Research Society, oktober 1995

This long-standing proceedings series is highly regarded as a premier forum for the discussion of mi... Celoten opis

Koda Libristo: 02060054

56 b

Kmalu

23.20 €

Pričakovani ponatis

Datum neznan

Do 30 dni za vračilo

Drugi so kupili tudi

Kochen mit... Bananen Götz Gußmann

Trda

7.56 €

Seeing Zumthor Kobi Gantenbein

Trda

35.21 €

Finanzmarktintegration durch Insolvenzrechtsharmonisierung Andy Ruzik

Trda

170.96 €

Unsere ersten Ziegen Anne-Kathrin Gomringer

Mehka

14.12 €

Histoires autour de sages fous et de fous sages Lagny Delatour

Mehka

18.86 €

This long-standing proceedings series is highly regarded as a premier forum for the discussion of microelectronics reliability issues. In this fifth book, emphasis is on the fundamental understanding of failure phenomena in thin-film materials. Special attention is given to electromigration and mechanical stress effects. The reliability of thin dielectrics and hot carrier degradation of transistors are also featured. Topics include: modeling and simulation of failure mechanisms; reliability issues for submicron IC technologies and packaging; stresses in thin films/lines; gate oxides; barrier layers; electromigration mechanisms; reliability issues for Cu metallizations; electromigration and microstructure; electromigration and stress voiding in circuit interconnects; and resistance measurements of electromigration damage.