LIBRISTO
LIBROAMANTO
obvezno
Postanite del skupnosti ljubiteljev knjig z vsega sveta in uživajte v številnih ugodnostih. Ustvarite brezplačen račun
0
Brezplačna dostava Zásilkovna nad 69.99 €
Zbirna točka GLS 4.49 Zbirna točka DPD 2.99 Kurirska služba GLS 5.49 Kurir DPD 3.49 Kurirska služba 3.49 Zbirno mesto 3.49 Zbirno mesto 3.49 Dostava preko Pošte Slovenije 3.49

Brezplačna dostava za naročila nad 69.99 € na paketomatih Pošte Slovenije.

Atomic Force Microscopy: Principles, Developments and Applications

Jezik AngleščinaAngleščina
Knjiga Mehka
Knjiga Atomic Force Microscopy: Principles, Developments and Applications Bessie Moss
Koda Libristo: 21019143
Založba Nova Science Publishers Inc, april 2018
Atomic Force Microscopy: Principles, Developments and Applications presents Atomic Force Microscopy... Celoten opis
? points 281 b
116.47
50% možnost Preiskali bomo ves svet Kdaj dobim knjigo?

30 dni za vračilo blaga

Atomic Force Microscopy: Principles, Developments and Applications presents Atomic Force Microscopy (AFM) as one of the most powerful tools for the analysis of morphologies because it creates three-dimensional images at the angstrom and nano scale. This technique has been exhaustively used in the analyses of the dispersion of nanometric components in nanocomposites and in polymeric blends because of the easiness of the sample preparation and lower equipment maintenance costs compared to the electron microscopy. Contributions to different application areas using the AFM are described, emphasizing the analysis of the morphology of composites/nanocomposites and polymeric blends based on elastomeric materials. Following this, the authors examine the basic concept of DEP and its integration with AFM to generate DEP, as well as review DEP-based AFM methods of imaging local electric polarizability with nanoscale spatial resolution. The direct measurement of DEP strength and polarity using a multi-pass AFM technique is described, contributing to the optimization and calibration of DEP integrated nano-devices for the effective control and manipulation of target biomolecules. The combination of in situ AFM-study of model crystals and ex situ-scanning of natural crystals makes it possible to carry out a partial reconstruction of natural crystallogenetics processes. With the use of these methods and microtomography, the authors estimate the concentration of silica in the mother solution at the time of capture of inclusions was estimated for the first time. Next, a study is presented with the goal of evaluating the morphology of surface asphalt films obtained through spin coating and characterized by AFM. The samples were pure asphalt and modified with two types of asphaltenes called continental type and archipelago type. The asphaltene fractions in the micellar system define the morphological stability of the asphalt resulting from a contribution of all the existing forces between the supramolecules of the system. The closing study presents in situ AFM investigations of crystal dissolution. The statistical data shows considerable differences in tangential dissolution rate on the two spirals consisting of nine and four screw dislocations.

Igralka & Poliglotka
EWA KASP za
Predvajaj video
Ewa Kasp
Libristo ima največjo izbiro tujejezične literature. Zato svoje knjige kupujem tukaj.

O knjigi

Polni naslov Atomic Force Microscopy: Principles, Developments and Applications
Avtor Bessie Moss
Jezik Angleščina
Vezava Knjiga - Mehka
Datum izida 2018
Število strani 131
EAN 9781536134957
ISBN 1536134953
Koda Libristo 21019143
Teža 202
Mere 155 x 230
Podarite to knjigo še danes
To je povsem preprosto
1 Dodajte knjigo v košarico in izberite dostavo kot darilo 2 V zameno vam bomo poslali kupon 3 Knjiga bo dostavljena na naslov obdarovanca

Prijava

Prijavite se v svoj račun. Še nimate računa Libristo? Ustvarite ga zdaj!

 
obvezno
obvezno

Še nimate računa? Izkoristite prednosti računa Libristo!

Z računom Libristo boste imeli vedno vse pod nadzorom.

Ustvarite račun Libristo
Knjižni svetovalec Libroamiko
Pozdravljeni, sem Libroamiko, vam lahko pomagam?