Brezplačna dostava za naročila nad 69.99 € na paketomatih Pošte Slovenije.

Preverjanje stanja naročila

Postanite del skupnosti ljubiteljev knjig z vsega sveta in uživajte v številnih ugodnostih. Ustvarite brezplačen račun

Brezplačna dostava Zásilkovna nad 69.99 €

Zbirna točka GLS 4.49 € Zbirna točka DPD 2.99 € Kurirska služba GLS 5.49 € Kurir DPD 3.49 € Kurirska služba 3.49 € Zbirno mesto 3.49 € Zbirno mesto 3.49 € Dostava preko Pošte Slovenije 3.49 €

Kontakt

Kako nakupovati

Pomoč

Moj račun

▸ Prazna :-(

Brezplačna dostava za naročila nad 69.99 € na paketomatih Pošte Slovenije.

Multi-run Memory Tests for Pattern Sensitive Faults

Name: Multi-run Memory Tests for Pattern Sensitive Faults
Brand: Springer
SKU: 41047385
Price: 54.37 EUR
Availability: InStock
Author: Ireneusz Mrozek
ISBN: 9783319912042

Ireneusz Mrozek

Jezik

Angleščina

E-knjiga Adobe ePub DRM

Koda Libristo: 41047385

Založba Springer, julij 2018

This book describes efficient techniques for production testing as well as for periodic maintenance... Celoten opis

Koda Libristo: 41047385

131 b

54.37 €

Na zalogi Prenesi zdaj

This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations.Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process;Presents practical algorithms for design and implementation of efficient multi-run tests;Demonstrates methods verified by analytical and experimental investigations.