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Field Emission Scanning Electron Microscopy

Name: Field Emission Scanning Electron Microscopy
Brand: Springer
SKU: 41332823
Price: 73.34 EUR
Availability: InStock
Author: Nicolas Brodusch
ISBN: 9789811044335

New Perspectives for Materials Characterization

Nicolas Brodusch

Hendrix Demers

Raynald Gauvin

Jezik

Angleščina

E-knjiga Adobe ePub DRM

Koda Libristo: 41332823

Založba Springer, september 2017

This book highlights what is now achievable in terms of materials characterization with the new gene... Celoten opis

Koda Libristo: 41332823

177 b

73.34 €

Na zalogi Prenesi zdaj

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage