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Conductive Atomic Force Microscopy

Name: Conductive Atomic Force Microscopy
Brand: Wiley-VCH
SKU: 41064491
Price: 163.12 EUR
Availability: InStock
Author: Mario Lanza
ISBN: 9783527699797

Mario Lanza

Jezik

Angleščina

E-knjiga Adobe ePub DRM

Koda Libristo: 41064491

Založba Wiley-VCH, avgust 2017

The first book to summarize the applications of CAFM as the most important method in the study of el... Celoten opis

Koda Libristo: 41064491

394 b

163.12 €

Na zalogi Prenesi zdaj

The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM. With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.