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Atomic Force Microscopy

Name: Atomic Force Microscopy
Brand: John Wiley & Sons Inc
SKU: 39911514
Price: 157.38 EUR
Availability: InStock
Author: Greg Haugstad
ISBN: 9781118360682

Greg Haugstad

Jezik

Angleščina

E-knjiga Adobe ePub DRM

Koda Libristo: 39911514

Založba John Wiley & Sons Inc, september 2012

This book enlightens readers on the basic surface properties and distance-dependent intersurface for... Celoten opis

Koda Libristo: 39911514

380 b

157.38 €

Na zalogi Prenesi zdaj

This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions. Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com